000			01143cam a22003138i 4500
001			22325654
003			OSt
005			20250612122733.0
008			211130s2022 nyu b 001 0 eng
020			_a9781108418096
040			_aDLC _beng _erda _cNUST _dNUST
050	0	0	_aQD506 MOR
100	1		_aMoritz, Wolfgang, _d1943- _eauthor.
245	1	0	_aSurface structure determination by LEED and X-rays / _cWolfgang Moritz, University of Munich, Michel A. Van Hove, Hong Kong Baptist University.
250			_aFirst edition.
260			_aUnited Kingdom, _bCambridge, _c©2022.
300			_axxiii,431pages : _billustrations, _c25 cm.
336			_atext _btxt _2rdacontent
337			_aunmediated _bn _2rdamedia
338			_avolume _bnc _2rdacarrier
504			_aIncludes bibliographical references and index.
650		0	_aSurface chemistry.
650		0	_aSurfaces (Technology) _xAnalysis.
650		0	_aLow energy electron diffraction.
650		0	_aX-ray diffraction imaging.
650		0	_aChemical structure.
700	1		_aVan Hove, M. A. _q(Michael A.), _d1947- _eauthor.
942			_2lcc _n0 _cBOOKS _hQD506.MOR _kQD _mMOR
999			_c171843 _d171843