Applications of atomic spectrometry to regulatory compliance monitoring / Stephen W. Jenniss, Sidney A. Katz, Richard W. Lynch.

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TextPublication details: New York : Wiley-VCH, c1997.Edition: 2nd edDescription: xviii, 248 p. : ill. ; 25 cmISBN:

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Ordinary Loan Books

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Cover image	Item type	Current library	Home library	Collection	Shelving location	Call number	Materials specified	Vol info	URL	Copy number	Status	Notes	Date due	Barcode	Item holds	Item hold queue priority	Course reserves
	Ordinary Loan Books	Main Library		NFIC		QD96 JEN (Browse shelf(Opens below))					Available			92003018492

Includes bibliographical references.

Includes index.

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