<?xml version="1.0" encoding="utf-8" ?> <rss version="2.0" xmlns:opensearch="http://a9.com/-/spec/opensearch/1.1/" xmlns:dc="http://purl.org/dc/elements/1.1/" xmlns:atom="http://www.w3.org/2005/Atom"> <channel> <title> <![CDATA[NUST Library Search for 'su:&quot;Electron microscopy.&quot;']]> </title> <!-- prettier-ignore-start --> <link> /cgi-bin/koha/opac-search.pl?q=ccl=su%3A%22Electron%20microscopy.%22&#38;sort_by=relevance&#38;format=rss </link> <!-- prettier-ignore-end --> <atom:link rel="self" type="application/rss+xml" href="/cgi-bin/koha/opac-search.pl?q=ccl=su%3A%22Electron%20microscopy.%22&#38;sort_by=relevance&#38;format=rss" /> <description> <![CDATA[ Search results for 'su:&quot;Electron microscopy.&quot;' at NUST Library]]> </description> <opensearch:totalResults>9</opensearch:totalResults> <opensearch:startIndex>0</opensearch:startIndex> <opensearch:itemsPerPage>50</opensearch:itemsPerPage> <atom:link rel="search" type="application/opensearchdescription+xml" href="/cgi-bin/koha/opac-search.pl?q=ccl=su%3A%22Electron%20microscopy.%22&#38;sort_by=relevance&#38;format=opensearchdescription" /> <opensearch:Query role="request" searchTerms="q%3Dccl%3Dsu%253A%2522Electron%2520microscopy.%2522" startPage="" /> <item> <title> Scanning electron microscopy and x-ray microanalysis / </title> <dc:identifier>ISBN:047191391X (pbk.) </dc:identifier> <!-- prettier-ignore-start --> <link>/cgi-bin/koha/opac-detail.pl?biblionumber=97377</link> <!-- prettier-ignore-end --> <description> <![CDATA[ <p> By Lawes, Graham..<br /> Chichester [West Sussex] : Published on behalf of ACOL, Thames Polytecnic, London, by Wiley, 1987 .<br /> xvii, 103 p., [1] leaf of plate : 23 cm..<br /> 047191391X (pbk.) </p> ]]> <![CDATA[ <p> <a href="/cgi-bin/koha/opac-reserve.pl?biblionumber=97377">Place hold on <em>Scanning electron microscopy and x-ray microanalysis /</em></a> </p> ]]> </description> <guid>/cgi-bin/koha/opac-detail.pl?biblionumber=97377</guid> </item> <item> <title> High-resolution electron microscopy / </title> <dc:identifier>ISBN:9780199552757 (pbk.)</dc:identifier> <!-- prettier-ignore-start --> <link>/cgi-bin/koha/opac-detail.pl?biblionumber=128005</link> <!-- prettier-ignore-end --> <description> <![CDATA[ <p> By Spence, John C. H..<br /> Oxford : Oxford University Press, 2003 .<br /> xvi, 401 p. : , Includes index. 24 cm..<br /> 9780199552757 (pbk.) </p> ]]> <![CDATA[ <p> <a href="/cgi-bin/koha/opac-reserve.pl?biblionumber=128005">Place hold on <em>High-resolution electron microscopy /</em></a> </p> ]]> </description> <guid>/cgi-bin/koha/opac-detail.pl?biblionumber=128005</guid> </item> <item> <title> The principles and practice of electron microscopy / </title> <dc:identifier>ISBN:0521435919 (pbk. )</dc:identifier> <!-- prettier-ignore-start --> <link>/cgi-bin/koha/opac-detail.pl?biblionumber=134958</link> <!-- prettier-ignore-end --> <description> <![CDATA[ <p> By Watt, Ian M..<br /> Cambridge : Cambridge University Press, 1997 .<br /> x, 484 p. : , Includes index. 26 cm..<br /> 0521435919 (pbk. ) </p> ]]> <![CDATA[ <p> <a href="/cgi-bin/koha/opac-reserve.pl?biblionumber=134958">Place hold on <em>The principles and practice of electron microscopy /</em></a> </p> ]]> </description> <guid>/cgi-bin/koha/opac-detail.pl?biblionumber=134958</guid> </item> <item> <title> Light and electron microscopy / </title> <dc:identifier>ISBN:0521339480 (pbk.)</dc:identifier> <!-- prettier-ignore-start --> <link>/cgi-bin/koha/opac-detail.pl?biblionumber=142840</link> <!-- prettier-ignore-end --> <description> <![CDATA[ <p> By Slayter, Elizabeth M..<br /> New York : Cambridge University Press, 1992 .<br /> xvi, 312 p. : , Includes index. 24 cm..<br /> 0521339480 (pbk.) </p> ]]> <![CDATA[ <p> <a href="/cgi-bin/koha/opac-reserve.pl?biblionumber=142840">Place hold on <em>Light and electron microscopy /</em></a> </p> ]]> </description> <guid>/cgi-bin/koha/opac-detail.pl?biblionumber=142840</guid> </item> <item> <title> Electron microprobe analysis and scanning electron microscopy in geology / </title> <dc:identifier>ISBN:0521483506 (pbk)</dc:identifier> <!-- prettier-ignore-start --> <link>/cgi-bin/koha/opac-detail.pl?biblionumber=144795</link> <!-- prettier-ignore-end --> <description> <![CDATA[ <p> By Reed, S. J. B..<br /> Cambridge : Cambridge University Press, 1996 .<br /> xii, 201 p. : 26 cm..<br /> 0521483506 (pbk) </p> ]]> <![CDATA[ <p> <a href="/cgi-bin/koha/opac-reserve.pl?biblionumber=144795">Place hold on <em>Electron microprobe analysis and scanning electron microscopy in geology /</em></a> </p> ]]> </description> <guid>/cgi-bin/koha/opac-detail.pl?biblionumber=144795</guid> </item> <item> <title> The principles and practice of electron microscopy / </title> <dc:identifier>ISBN:0521435919 (pbk. )</dc:identifier> <!-- prettier-ignore-start --> <link>/cgi-bin/koha/opac-detail.pl?biblionumber=152844</link> <!-- prettier-ignore-end --> <description> <![CDATA[ <p> By Watt, Ian M..<br /> Cambridge : Cambridge University Press, 1997 .<br /> x, 484 p. : , Includes index. 26 cm..<br /> 0521435919 (pbk. ) </p> ]]> <![CDATA[ <p> <a href="/cgi-bin/koha/opac-reserve.pl?biblionumber=152844">Place hold on <em>The principles and practice of electron microscopy /</em></a> </p> ]]> </description> <guid>/cgi-bin/koha/opac-detail.pl?biblionumber=152844</guid> </item> <item> <title> Electron microscopy and analysis / </title> <dc:identifier>ISBN:0850664144 (pbk.)</dc:identifier> <!-- prettier-ignore-start --> <link>/cgi-bin/koha/opac-detail.pl?biblionumber=153219</link> <!-- prettier-ignore-end --> <description> <![CDATA[ <p> By Goodhew, P. J..<br /> London : Wykeham Publications, 1975 .<br /> xi, 232 p. : , Includes index. 24 cm..<br /> 0850664144 (pbk.) </p> ]]> <![CDATA[ <p> <a href="/cgi-bin/koha/opac-reserve.pl?biblionumber=153219">Place hold on <em>Electron microscopy and analysis /</em></a> </p> ]]> </description> <guid>/cgi-bin/koha/opac-detail.pl?biblionumber=153219</guid> </item> <item> <title> Introduction to electron microscopy / </title> <dc:identifier>ISBN:0080096700 (hbk.)</dc:identifier> <!-- prettier-ignore-start --> <link>/cgi-bin/koha/opac-detail.pl?biblionumber=154150</link> <!-- prettier-ignore-end --> <description> <![CDATA[ <p> By Wischnitzer, Saul..<br /> New York : Pergamon Press, 1970 .<br /> viii, 292 p. , Includes indexes. 24 cm..<br /> 0080096700 (hbk.) </p> ]]> <![CDATA[ <p> <a href="/cgi-bin/koha/opac-reserve.pl?biblionumber=154150">Place hold on <em>Introduction to electron microscopy /</em></a> </p> ]]> </description> <guid>/cgi-bin/koha/opac-detail.pl?biblionumber=154150</guid> </item> <item> <title> Light and electron microscopy / </title> <dc:identifier>ISBN:0521339480 (pbk.)</dc:identifier> <!-- prettier-ignore-start --> <link>/cgi-bin/koha/opac-detail.pl?biblionumber=158508</link> <!-- prettier-ignore-end --> <description> <![CDATA[ <p> By Slayter, Elizabeth M..<br /> New York : Cambridge University Press, 1992 .<br /> xvi, 312 p. : , Includes index. 24 cm..<br /> 0521339480 (pbk.) </p> ]]> <![CDATA[ <p> <a href="/cgi-bin/koha/opac-reserve.pl?biblionumber=158508">Place hold on <em>Light and electron microscopy /</em></a> </p> ]]> </description> <guid>/cgi-bin/koha/opac-detail.pl?biblionumber=158508</guid> </item> </channel> </rss>
