<?xml version="1.0" encoding="utf-8" ?> <rss version="2.0" xmlns:opensearch="http://a9.com/-/spec/opensearch/1.1/" xmlns:dc="http://purl.org/dc/elements/1.1/" xmlns:atom="http://www.w3.org/2005/Atom"> <channel> <title> <![CDATA[NUST Library Search for 'su:&quot;Diffraction.&quot;']]> </title> <!-- prettier-ignore-start --> <link> /cgi-bin/koha/opac-search.pl?q=ccl=su%3A%22Diffraction.%22&#38;sort_by=relevance&#38;format=rss </link> <!-- prettier-ignore-end --> <atom:link rel="self" type="application/rss+xml" href="/cgi-bin/koha/opac-search.pl?q=ccl=su%3A%22Diffraction.%22&#38;sort_by=relevance&#38;format=rss" /> <description> <![CDATA[ Search results for 'su:&quot;Diffraction.&quot;' at NUST Library]]> </description> <opensearch:totalResults>10</opensearch:totalResults> <opensearch:startIndex>0</opensearch:startIndex> <opensearch:itemsPerPage>50</opensearch:itemsPerPage> <atom:link rel="search" type="application/opensearchdescription+xml" href="/cgi-bin/koha/opac-search.pl?q=ccl=su%3A%22Diffraction.%22&#38;sort_by=relevance&#38;format=opensearchdescription" /> <opensearch:Query role="request" searchTerms="q%3Dccl%3Dsu%253A%2522Diffraction.%2522" startPage="" /> <item> <title> X-ray methods / </title> <dc:identifier>ISBN:0471913871 (pbk.) </dc:identifier> <!-- prettier-ignore-start --> <link>/cgi-bin/koha/opac-detail.pl?biblionumber=97386</link> <!-- prettier-ignore-end --> <description> <![CDATA[ <p> By Whiston, Clive..<br /> Chichester : New York, 1987 .<br /> xxi, 426 p. : 23 cm..<br /> 0471913871 (pbk.) </p> ]]> <![CDATA[ <p> <a href="/cgi-bin/koha/opac-reserve.pl?biblionumber=97386">Place hold on <em>X-ray methods /</em></a> </p> ]]> </description> <guid>/cgi-bin/koha/opac-detail.pl?biblionumber=97386</guid> </item> <item> <title> Electron diffraction techniques / </title> <dc:identifier>ISBN:019855558X (v. 1) (cased.)</dc:identifier> <!-- prettier-ignore-start --> <link>/cgi-bin/koha/opac-detail.pl?biblionumber=142786</link> <!-- prettier-ignore-end --> <description> <![CDATA[ <p> Oxford : Oxford University Press, 1992 .<br /> 1 v. : , Includes index. 25 cm..<br /> 019855558X (v. 1) (cased.) </p> ]]> <![CDATA[ <p> <a href="/cgi-bin/koha/opac-reserve.pl?biblionumber=142786">Place hold on <em>Electron diffraction techniques /</em></a> </p> ]]> </description> <guid>/cgi-bin/koha/opac-detail.pl?biblionumber=142786</guid> </item> <item> <title> Diffraction methods / </title> <dc:identifier>ISBN:</dc:identifier> <!-- prettier-ignore-start --> <link>/cgi-bin/koha/opac-detail.pl?biblionumber=153139</link> <!-- prettier-ignore-end --> <description> <![CDATA[ <p> By Wormald, John Roger..<br /> Oxford : Clarendon Press, 1973 .<br /> xii, 100 p. : 22 cm..<br /> </p> ]]> <![CDATA[ <p> <a href="/cgi-bin/koha/opac-reserve.pl?biblionumber=153139">Place hold on <em>Diffraction methods /</em></a> </p> ]]> </description> <guid>/cgi-bin/koha/opac-detail.pl?biblionumber=153139</guid> </item> <item> <title> The Rietveld method / </title> <dc:identifier>ISBN:0198559127 (pbk.)</dc:identifier> <!-- prettier-ignore-start --> <link>/cgi-bin/koha/opac-detail.pl?biblionumber=153241</link> <!-- prettier-ignore-end --> <description> <![CDATA[ <p> [Chester, England] : International Union of Crystallograhy, 1993 .<br /> x, 298 p. : , Includes index. 24 cm..<br /> 0198559127 (pbk.) </p> ]]> <![CDATA[ <p> <a href="/cgi-bin/koha/opac-reserve.pl?biblionumber=153241">Place hold on <em>The Rietveld method /</em></a> </p> ]]> </description> <guid>/cgi-bin/koha/opac-detail.pl?biblionumber=153241</guid> </item> <item> <title> Diffractive optics for industrial and commercial applications / </title> <dc:identifier>ISBN:3055017331(hbk)</dc:identifier> <!-- prettier-ignore-start --> <link>/cgi-bin/koha/opac-detail.pl?biblionumber=155386</link> <!-- prettier-ignore-end --> <description> <![CDATA[ <p> Berlin : Akademie Verlag, 1997 .<br /> xiv, 426 p. : , Includes index 25 cm..<br /> 3055017331(hbk) </p> ]]> <![CDATA[ <p> <a href="/cgi-bin/koha/opac-reserve.pl?biblionumber=155386">Place hold on <em>Diffractive optics for industrial and commercial applications /</em></a> </p> ]]> </description> <guid>/cgi-bin/koha/opac-detail.pl?biblionumber=155386</guid> </item> <item> <title> Diffraction methods / </title> <dc:identifier>ISBN:</dc:identifier> <!-- prettier-ignore-start --> <link>/cgi-bin/koha/opac-detail.pl?biblionumber=155598</link> <!-- prettier-ignore-end --> <description> <![CDATA[ <p> By Wormald, John Roger..<br /> Oxford : Clarendon Press, 1973 .<br /> xii, 100 p. : 22 cm..<br /> </p> ]]> <![CDATA[ <p> <a href="/cgi-bin/koha/opac-reserve.pl?biblionumber=155598">Place hold on <em>Diffraction methods /</em></a> </p> ]]> </description> <guid>/cgi-bin/koha/opac-detail.pl?biblionumber=155598</guid> </item> <item> <title> Diffractive optics for industrial and commercial applications / </title> <dc:identifier>ISBN:3055017331(hbk)</dc:identifier> <!-- prettier-ignore-start --> <link>/cgi-bin/koha/opac-detail.pl?biblionumber=160177</link> <!-- prettier-ignore-end --> <description> <![CDATA[ <p> Berlin : Akademie Verlag, 1997 .<br /> xiv, 426 p. : , Includes index 25 cm..<br /> 3055017331(hbk) </p> ]]> <![CDATA[ <p> <a href="/cgi-bin/koha/opac-reserve.pl?biblionumber=160177">Place hold on <em>Diffractive optics for industrial and commercial applications /</em></a> </p> ]]> </description> <guid>/cgi-bin/koha/opac-detail.pl?biblionumber=160177</guid> </item> <item> <title> Elements of x-ray diffraction / </title> <dc:identifier>ISBN:0201011743 (hbk.)</dc:identifier> <!-- prettier-ignore-start --> <link>/cgi-bin/koha/opac-detail.pl?biblionumber=161640</link> <!-- prettier-ignore-end --> <description> <![CDATA[ <p> By Cullity, B.D..<br /> Reading : Addison-Wesley Pub. Co., 1978 .<br /> xii, 555 p. : , Includes index. 25 cm..<br /> 0201011743 (hbk.) </p> ]]> <![CDATA[ <p> <a href="/cgi-bin/koha/opac-reserve.pl?biblionumber=161640">Place hold on <em>Elements of x-ray diffraction /</em></a> </p> ]]> </description> <guid>/cgi-bin/koha/opac-detail.pl?biblionumber=161640</guid> </item> <item> <title> Structure from diffraction methods / </title> <dc:identifier>ISBN:9781119953227 (hardcover)</dc:identifier> <!-- prettier-ignore-start --> <link>/cgi-bin/koha/opac-detail.pl?biblionumber=170731</link> <!-- prettier-ignore-end --> <description> <![CDATA[ <p> United Kingdom : Wiley &amp; Sons, 2014 .<br /> xiv, 338 pages : 24 cm..<br /> 9781119953227 (hardcover) </p> ]]> <![CDATA[ <p> <a href="/cgi-bin/koha/opac-reserve.pl?biblionumber=170731">Place hold on <em>Structure from diffraction methods /</em></a> </p> ]]> </description> <guid>/cgi-bin/koha/opac-detail.pl?biblionumber=170731</guid> </item> <item> <title> Surface structure determination by LEED and X-rays / </title> <dc:identifier>ISBN:9781108418096</dc:identifier> <!-- prettier-ignore-start --> <link>/cgi-bin/koha/opac-detail.pl?biblionumber=171843</link> <!-- prettier-ignore-end --> <description> <![CDATA[ <p> By Moritz, Wolfgang,.<br /> United Kingdom, Cambridge, 2022 .<br /> xxiii,431pages : 25 cm..<br /> 9781108418096 </p> ]]> <![CDATA[ <p> <a href="/cgi-bin/koha/opac-reserve.pl?biblionumber=171843">Place hold on <em>Surface structure determination by LEED and X-rays /</em></a> </p> ]]> </description> <guid>/cgi-bin/koha/opac-detail.pl?biblionumber=171843</guid> </item> </channel> </rss>
