TY  - BOOK
AU  - Feldman,Leonard C.
AU  - Mayer,James W.
TI  - Fundamentals of surface and thin film analysis
SN  - 0135005701 (pbk.)
AV  - QD506 
PY  - 1986///
CY  - Englewood Cliffs
PB  - Prentice-Hall
KW  - Surfaces (Technology)
KW  - Analysis
KW  - Thin films
N1  - Includes index; Includes bibliographical references
ER  -