Feldman, Leonard C. <br/><br/>
Fundamentals of surface and thin film analysis / 
Leonard C. Feldman and James W. Mayer. 
 - Englewood Cliffs :  Prentice-Hall,  c1986. 
 - xviii, 352 p. :  ill. ;  23 cm. 
<br/><br/> Includes index. 
<br/><br/>Includes bibliographical references. 
<br/><br/><label>ISBN: </label>0135005701 (pbk.) 
<br/><br/><label>Subjects--Topical Terms: </label><br/>Surfaces (Technology)--Analysis.<br/>Thin films--Analysis.
<br/><br/><label>LC Class. No.: </label>QD506